元器件交易网
HCF4052B
DCSPECIFICATIONS
TestCondition
Symbol
Parameter
VIS(V)
VEE(V)
VSS(V)
VDD(V)5101520510155101518
TA=25°CMin.
Typ.0.040.040.040.0847018012510105±0.1
Max.510201001050400280
Value
-40to85°C-55to125°CUnitMin.
Max.15030060030001200520360
Min.
Max.15030060030001200520360
IL
QuiescentDeviceCurrent(all
switchesONorallswitchesOFF)
µA
SWITCH
RONResistance
0VIVDD0VIVDD
00
ON
Resistance RON(betweenany2of4switches)ChannelLeakageCurrent(AllChannelOFF)(COMMONO/I)ChannelLeakageCurrent(AnyChannelOFF)InputCapacitanceOutput
CapacitanceFeedthrough
00
00
100
1000
1000
nA
OFF*
OFF*0018±0.110010001000nA
CICOCIO
5
-5
-5
5
180.2
VEE=VSSRL=1K toVSSIIS<2µA(onallOFFchannels)
510155101518
1.534
3.5711
±10-35
±0.17.5
3.5711
±11.534
3.5711
±11.534
pF
CONTROL(AddressorInhibit)
InputLowVoltageVIL
=VDD
thru1K
V
VIH
InputHighVoltage
VµApF
IIH,IILCI
InputLeakageCurrent
InputCapacitance
VI=0/18V
*Determinedbyminimumfeasibleleakagemeasurementforautomatingtesting.
4/11
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