節點J201-1 與J201-2 之間應該有短路(小於臨界阻抗9ohm) ，待測板上卻量測為開路(>9ohm),
22072 代表節點J201-1 所連接的MINT pin(BRC) 。
-------------------------------------------------------------- Short #1, Thresh 1000, Delay 50us Ohms From: CR201-C 22163 3 To: VR201-C 22162 3
Total of 2 nodes, Message is: None.
-------------------------------------------------------------- Short 代表短路不良
節點CR201-C 與VR201-C 之間應該是開路(臨界阻抗1000ohm) ，待測板上卻量測為短路，量
測值為3ohm，小於臨界阻抗。
2. analog in-circuit
---------------------------------------- r205 HAS FAILED Measured: 1.9413M Nominal: 1.0000k High Limit: 1.0836k Low Limit: 962.20 Resistance in OHMS
----------------------------------------
電阻不良，R205 應該是1kohm 的電阻，上限1.0836kohm，下限962.2ohm，卻量測到
1.9413Mohm。
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---------------------------------------- l201 HAS FAILED Measured: -17.153 Nominal: 10.000m High Limit: 10.897m Low Limit: 9.8110m Inductance in HENRYS
---------------------------------------- 電感L201 不良。
---------------------------------------- cb313 HAS FAILED Measured: -2839.8p Nominal: 66.660u
High Limit: 72.086u Low Limit: 54.061u Capacitance in FARADS
---------------------------------------- DEVICES IN PARALLEL cb314 22.0u cb315 22.0u cb301 100n cb302 100n
----------------------------------------
電容CB313 不良，並聯元件有CB314、CB315、CB301、CB302。
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---------------------------------------- d1 HAS FAILED Measured: 1.4187 High Limit: 828.00m Low Limit: 213.00m Forward VOLTAGE drop Status: 2cH
Moa Voltage/Current Compliance Detector Over Range Integrator Over Voltage
----------------------------------------
二極體D1 不良,導通電壓上限828mV、下限213mV，量測值為1.4187V。 ---------------------------------------- q201 HAS FAILED Subtest: B-E
Measured: 1.4048 High Limit: 806.00m Low Limit: 603.00m Forward VOLTAGE drop Status: 2cH
Moa Voltage/Current Compliance Detector Over Range Integrator Over Voltage
---------------------------------------- 1:q201 HAS FAILED Subtest: B-C
Measured: 1.4048 High Limit: 806.00m
Low Limit: 603.00m Forward VOLTAGE drop Status: 2cH
Moa Voltage/Current Compliance Detector Over Range Integrator Over Voltage
----------------------------------------
電晶體Q201 不良，B-E 極B-C 極導通電壓皆量測不良。
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3. testjet
---------------------------------------- Open #1 Device u1 Pin 1 Node DVOCLKOUT Measured 2.0 (BRC 21423) Open #2 Device u1 Pin 10 Node DRV2A Through c12
Measured 3.6 (BRC 214104)
----------------------------------------
元件U10 第1 腳及第10 腳不良，第1 腳之節點為DVOCLKOUT 量測值為2fF。
若有使用drive through 則如第10 腳之訊息，由節點DRV2A 送入訊號經過C12 來量測,量測值 為3.6fF。
4. power supply
---------------------------------------- Power Supply Number 2
In Current Limit
________________________________________ Check for backwards IC's or Capacitors.
________________________________________ 電源過電流錯誤訊息。
power supply number 2 已送出所指定之最大電流，可是仍未達到所指定之電壓. 。
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5. digital test
----------------------------------------
u301 HAS FAILED
vector = 32 ??執行時第32 支vector
user vector = 10 ??程式描述中第10 支vector source line = 271 ??程式中的第271 行 source file = digital/u301 Status: 15H
Pass/Fail error on following pins: BRRCC NODE PIN
21444 RIPPLE U301.15 ?此pin 接收到與預計要接收之訊號 ---------------------------------------- 不同 u302 HAS FAILED vector near 52
user vector near 28 source line near 331
source file = digital/u302 Status: 1041H
Software timeout occurred and forced ??一直沒有滿足homingloop 之條件, the sequencer to stop 使程式無法跳出 Clocks were on when stopped
---------------------------------------- 元件U301,U302 不良
Note1：因為程式中有homingloop 或repeat loop，使得同一支vector 在程式中和實際執行時會有 不同的序號。
Note2：數位測試較為複雜,error ticket 所列之pin 腳不一定就是不良，而是表示這支pin 腳接收到
之訊號與所期望之訊號不同。
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6. power analog
---------------------------------------- u17 HAS FAILED Subtest: output
Measured: 17.168m ??量測到之電壓 High Limit: 5.5000 ??電壓上限 Low Limit: 4.5000 ??電壓下限 Direct Current VOLTS
---------------------------------------- y1 HAS FAILED
Subtest: out
Measured: 10.357M ??量測到之頻率 High Limit: 15.000M ??頻率上限 Low Limit: 13.500M ??頻率下限 Frequency in HERTZ
---------------------------------------- y2 HAS FAILED Subtest: out
Measured: 2.0000e+100 High Limit: 73.500M Low Limit: 66.500M Frequency in HERTZ Status: 2000H
Timeout waiting for measurement complete ??表示完全沒有量到頻率 ----------------------------------------
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第三節如何debug analog 元件
1. 在testplan的視窗，執行load board |debug board 開啟Push Button Debug視窗。 2. 按下faon。
3. 在BT-BASIC中，輸入unpowered 按Enter 。
4. 在Push Button Debug 視窗,點選Debug?Debug Test?。
5. 輸入要debug 的零件，如：analog/c1，按ok，進入測試程式。
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